发明名称 FLUORESCENT X-RAY ANALYZER
摘要 PROBLEM TO BE SOLVED: To obtain a fluorescent X-ray analyzer which is simple to handle with. SOLUTION: The fluorescent X-ray analyzer is based on the X-ray fluorescence method and is of a system in which primary X rays are irradiated to a sample to be measured which is outside the apparatus. A light source 1 is set to an analyzer housing 2 to irradiate a luminous flux in an irradiation direction of primary X rays.
申请公布号 JP2002039975(A) 申请公布日期 2002.02.06
申请号 JP20000227377 申请日期 2000.07.27
申请人 SEIKO INSTRUMENTS INC 发明人 YAGI SHIGEKI
分类号 G01N23/223;G21K1/06;(IPC1-7):G01N23/223 主分类号 G01N23/223
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