| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing circuit and its testing method capable of verifying the operation of each block provided inside an LSI and readily clarifying the cause of problems which occur during the operation of the entire LSI. SOLUTION: A mode setting circuit 130 sets the testing mode and normal mode in accordance with a mode-switching signal MSW. In testing mode, a switching circuit 140 selects a signal specified by a block selecting signal BSL from a plurality of block output signals of the LSI according to the output signal of a decode circuit 120 and outputs it to the outside. In normal mode, by fixing each input terminal of the switching circuit 140 to a prescribed state, for example, a high-impedance state, the effects of each block on the output terminals can be suppressed and power consumption can be reduced.
|
