| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus for evaluating the characteristics of a waveguide, capable of simply evaluating the characteristics of the waveguide by elucidating in detail the influence of the higher mode of the waveguide which exertes large effects in an optical integrated circuit having advanced functions. SOLUTION: Light is incident on the waveguide 25, to be evaluated from an optical time-resolved reflection measuring instrument 21, and the reflected light from the waveguide 25 is received by the optical time-resolved reflection measuring instrument 21 via a fiber 22 and the connecting position shift quantity of the fiber 22 with the waveguide 25 is measured by a connecting position shift quantity measuring instrument 24, while the position of the fiber 22 to the waveguide 25 is adjusted by a position-adjusting device 23, to adjust the position of the fiber 22 with the waveguide 25, so that reflection peaks of higher modes become maximum. With this constitution, the relation between the connecting position shift quantity and a plurality of peak intensities generated by the time-resolved reflection of the intensity of the light transmitted through the waveguide 25 is measured continuously. |
