发明名称 Semiconductor device with reliable connection between projective electrode and conductive wire of the substrate
摘要 In a semiconductor device including a substrate which has a primary surface, a conduction wire formed on the primary surface, a semiconductor element which has a secondary surface, a projective electrode formed on the secondary surface, an insulative resin for adhesion which is applied between the primary surface and the secondary surface and which shrinks by hardening thereof, the substrate and the semiconductor element are adhered to each other by the hardening of the insulative resin with the projective electrode and the conduction wire corresponding with each other, so that an electrical connection between the projective electrode and the conduction wire is achieved and that a residual stress is generated in the insulative resin. The residual stress has a maximum value thereof around the projective electrode.
申请公布号 US6344372(B1) 申请公布日期 2002.02.05
申请号 US20000521890 申请日期 2000.03.09
申请人 NEC CORPORATION 发明人 OHUCHI RIEKA;SUZUKI TAKATOSHI
分类号 C09J163/00;H01L21/56;H01L21/60;H01L23/13;(IPC1-7):H01L21/44;H01L21/48;H01L21/50 主分类号 C09J163/00
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