PIN PROBE PRODUCING METHOD FOR INSPECTING TFT-LC

摘要

PURPOSE: A pin probe producing method for examining TFT-LCD(Thin Film Transistor Liquid Crystal Display) is provided to massively produce by using exposure process and to control pitch of a pin probe without removing a solder resistor. CONSTITUTION: A tungsten plate(4) is installed on a fixed plate to wash. A solder resister(12) is applied to both sides of the tungsten plate to exposure. A pitch is controlled by thickness of the solder resister through coating the solder resister without problem in a positive solder resister. A circular plate(13) having a pin probe shape is fixed on an exposure device. The solder resister is applied to a tungsten plate to be inserted into the exposure device. The pin probe of a plate shape is produced by etching work by transferring a mask of the solder resister into an etching device. The solder resister maintains the pitch with electrode of TFT-LCD by using a pitch-controlling jig. Thereby, a pin probe producing method for examining TFT-LCD controls the pitch of the pin probe without removing the solder resistor.