| 摘要 |
A test coupon is used to evaluate characteristics of multi-layer printed wiring boards. The coupon includes a multi-layer substrate which has at least first and second wiring layers. The first and second wiring layers are configured to correspond to a tested wiring layer and another wiring layer of the multi-layer printed wiring boards, respectively. Each of first and second through hole groups has a plurality of through holes which pass through the multi-layer substrate and which are arranged in an arranging direction. A first and second conductor patterns which are provided on the first and second wiring layers respectively extend substantially along the arranging direction.
|
