发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, having a pattern structure that will not cause deterioration in the performance of a transistor, when designing a semiconductor IC circuit for the semiconductor device. SOLUTION: First gate electrodes 1-4, which contribute to the operation of the transistor and second gate electrodes 19, 20 which do not contribute to the operation of the transistor, have the same length and are disposed with the same pitch along the gate length direction. Both end parts in the gate width direction of each of the first gate electrodes 1-4 and second gate electrodes 19, 20 are extended beyond the widths of the respective longest active regions.
申请公布号 JP2002026125(A) 申请公布日期 2002.01.25
申请号 JP20000207911 申请日期 2000.07.10
申请人 MITSUBISHI ELECTRIC CORP 发明人 MAKINO HIROYUKI
分类号 H01L21/82;H01L27/088;H01L27/118;(IPC1-7):H01L21/82 主分类号 H01L21/82
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