发明名称 SUBSTRATE FOR OPTICAL INSPECTION, OPTICAL INSPECTION METHOD USING IT, AND OPTICAL MODULE
摘要 PROBLEM TO BE SOLVED: To provide a substrate for optical inspection which can be applied to a high-speed module, an optical inspection method using the substrate, and an optical module loaded with an optical element. SOLUTION: The substrate P1 for optical inspection is provided with a substrate 11 having a plurality of optical element mounting areas on which a light emitting element and a light receiving element which receives the light emitted from the light emitting element are arranged, insulator layers 12 and 13 formed in a plurality of areas on the substrate 11, a signal line 15 and grounding conductor 16 connected to the electrode terminal of the light emitting element, and another signal line 17 and grounding conductor 1 connected to the electrode terminal of the light receiving element. The signal lines 15 and 17 of the light emitting and receiving elements are respectively laid on the separately formed insulator layers 12 and 13 and the grounding conductor of at least one of the light emitting and receiving elements is laid on one or both sides of the element.
申请公布号 JP2002026437(A) 申请公布日期 2002.01.25
申请号 JP20000211628 申请日期 2000.07.12
申请人 KYOCERA CORP 发明人 TAKEMURA KOJI;SAKUJIMA SHIROU
分类号 G02B6/42;H01L31/02;H01L31/0232;H01S5/00;H01S5/022;H01S5/026;(IPC1-7):H01S5/00;H01L31/023 主分类号 G02B6/42
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