发明名称 RESONANCE FREQUENCY MEASUREMENT DEVICE FOR PIEZOELECTRIC MATERIAL, RESONANCE FREQUENCY MEASUREMENT METHOD FOR PIEZOELECTRIC MATERIAL, FOREIGN MATERIAL ELIMINATING DEVICE FOR PIEZOELECTRIC MATERIAL, FOREIGN MATERIAL ELIMINATING METHOD FOR PIEZOELECTRIC MATERIAL, DEVICE FOR MANUFACTURING PIEZOELECTRIC MATERIAL AND METHOD FOR MANUFACTURING PIEZOELECTRIC MATERIAL
摘要 PROBLEM TO BE SOLVED: To provide a resonance frequency measurement device for a piezoelectric material that can accurately measure a resonance frequency of a piezoelectric material with a simple operation without being affected by a gap caused between the piezoelectric material and an electrode and to provide a foreign material eliminating device for a piezoelectric material that can obtain sufficient eliminating performance of a foreign material deposited on the surface of the piezoelectric material through a comparatively simple configuration. SOLUTION: While a blank B is placed between a couple of electrodes 11, 12 arranged opposite to each other, a high frequency signal is swept onto the blank B between the electrodes 11 and 12. A waveform detection circuit 4 detects a voltage waveform on the electrode 11, 12 in the case of applying the high frequency signal between the electrodes 11, 12. By recognizing the presence of a piezoelectric material resonance wave on the voltage waveform, whether or not the blank B is resonated, that is, whether or not the sweep frequency reaches the resonance frequency is discriminated so as to obtain the resonance frequency of the blank B.
申请公布号 JP2002026672(A) 申请公布日期 2002.01.25
申请号 JP20000206506 申请日期 2000.07.07
申请人 DAISHINKU CORP 发明人 OKAMOTO YUKIHIRO;INAMI YOSHIMI
分类号 H01L41/22;H03H3/02 主分类号 H01L41/22
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