发明名称 |
DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To reduce thermal stresses by making uniform the temperature distribution which is generated in the surface of a semiconductor wafer when the wafer is placed on a blade after the wafer is heat-treated. SOLUTION: The shape of the wafer placing portion of a blade 6 which transfers the semiconductor wafer is formed by copying the shape of the wafer so that the wafer 14 may come into contact with the whole surface of the portion. In addition, the portion has a plurality of slits 17 of <=20 mm in width.
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申请公布号 |
JP2002025990(A) |
申请公布日期 |
2002.01.25 |
申请号 |
JP20000210642 |
申请日期 |
2000.07.12 |
申请人 |
MITSUBISHI ELECTRIC CORP;RYODEN SEMICONDUCTOR SYST ENG CORP |
发明人 |
MARUYAMA TAKAHIRO;TAKADA SEIJI;OGATA KENICHI |
分类号 |
H01L21/302;H01L21/205;H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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