发明名称 X-RAY ANALYZER PROVIDED WITH MULTILAYERED MIRROR AND INJECTION COLLIMATOR
摘要 <p>PROBLEM TO BE SOLVED: To realize resolving power better than that obtained by a conventional apparatus. SOLUTION: The parallel radiation (12) emitted from the sample (4) in a known apparatus for X-ray analysis (e.g.; diffraction) is analyzed corresponding to a wavelength and matched with a focus 20 by a parabolic multilayered mirror 14. A collimator 28 is arranged in the vicinity of the focus. The resolving power of the apparatus is enhanced by making the angle passage width of the collimator smaller than the maximum rangeαmax of the angle of reflection of the apparatus. The resolving power of the apparatus is more excellently determined and the angle value of the passage width from each reflecting point (A or B) on the surface of the mirror is enhanced by introducing the injection collimator (28) so as to substancially depend on the position of the reflecting point. The injection collimator is formed in a shape of two mutually parallel knife edges arranged at different distances from the reflecting point of the multilayered mirror.</p>
申请公布号 JP2002022681(A) 申请公布日期 2002.01.23
申请号 JP20010159247 申请日期 2001.05.28
申请人 KONINKL PHILIPS ELECTRONICS NV 发明人 KOGAN VLADIMIR
分类号 G01N23/207;G01N23/223;G21K1/02;G21K1/06;(IPC1-7):G01N23/207 主分类号 G01N23/207
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