SEMICONDUCTOR MEMORY AND ITS EVALUATING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a means which can specify easily a trouble point in a power source boosting circuit caused by the insufficiency of boosting of VPP and can perform easily the evaluation of operation for each circuit block, and an evaluating and analyzing method using this means. SOLUTION: A power source boosting circuit (VPP generating circuit) of a semiconductor memory constituted of plural circuit blocks has a means which can evaluate individually respective operation of plural circuit blocks (2, 3, 4) constituting of operation switching circuits (5, 7) connecting or cutting off electrically at least two circuit blocks out of plural circuit blocks (2, 3, 4) by switching control signals (g, h), and electrode pads (6, 8) connecting the operation switching circuits (5, 7). Thus, operation can be evaluated for each circuit block, a trouble point can be narrowed down quickly.