| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which defect can be detected surely in a wafer state. SOLUTION: This semiconductor integrated circuit is provided with a memory cell array and a sense amplifier band. A sense amplifier/input-output control circuit included in the sense amplifier band is connected to a pair of bit line and a bit fine voltage supply wiring for supplying voltage to the bit line. In a sense amplifier band SBi-1, bit line voltage supply wirings VBL0, VBL2 being different from each other for the adjacent sense amplifier/input-output control circuit are arranged, in a sense amplifier band SBi, bit line voltage supply wirings VBL1, VBL3 being different from each other for the adjacent sense amplifier/input-output control circuit are arranged.
|
