发明名称 |
METHOD FOR PATTERN-FORMING BURIED OXIDE FILM THICKNESS FOR SIMOX (SILICON IMPLATED OXIDE) PROCESS |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming a pattern formation buried oxide film. SOLUTION: The method for forming the pattern formation buried oxide film comprises a step of carrying out implantation into a substrate, a step of forming a mask at least on part of the substrate in order to control implantation diffusion, and a step of annealing the substrate and forming a buried oxide. The mask can be selectively pattern-formed. A thinner buried oxide can be formed in a region coated by the mask than in a region exposed to an annealing atmosphere directly.
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申请公布号 |
JP2002009145(A) |
申请公布日期 |
2002.01.11 |
申请号 |
JP20010136570 |
申请日期 |
2001.05.07 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
COHEN GUY MOSHE;SADANA DEVENDRA KUMAR |
分类号 |
H01L21/76;H01L21/02;H01L21/265;H01L21/762;H01L27/12;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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