发明名称 METHOD FOR PATTERN-FORMING BURIED OXIDE FILM THICKNESS FOR SIMOX (SILICON IMPLATED OXIDE) PROCESS
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a pattern formation buried oxide film. SOLUTION: The method for forming the pattern formation buried oxide film comprises a step of carrying out implantation into a substrate, a step of forming a mask at least on part of the substrate in order to control implantation diffusion, and a step of annealing the substrate and forming a buried oxide. The mask can be selectively pattern-formed. A thinner buried oxide can be formed in a region coated by the mask than in a region exposed to an annealing atmosphere directly.
申请公布号 JP2002009145(A) 申请公布日期 2002.01.11
申请号 JP20010136570 申请日期 2001.05.07
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 COHEN GUY MOSHE;SADANA DEVENDRA KUMAR
分类号 H01L21/76;H01L21/02;H01L21/265;H01L21/762;H01L27/12;(IPC1-7):H01L21/76 主分类号 H01L21/76
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