| 摘要 |
PROBLEM TO BE SOLVED: To provide a photosensitive IC frequency characteristic screening apparatus for screening a photosensitive IC chip by measuring frequency characteristic of a circuit rapidly at a low cost, and a method thereof. SOLUTION: The photosensitive IC frequency characteristic screening apparatus screens a photosensitive IC chip according to frequency characteristic of a circuit. It comprises an AC light apparatus, which casts AC light on a photosensitive part of a photosensitive IC chip, and measuring equipment which measures output of a photosensitive IC.
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