摘要 |
Process involves classifying material processed by a reduction device into coarser and finer fractions and recirculating the coarser fraction for re-processing in the device. By setting a flow speed difference at a pressure stage between primary and secondary sifting circuits, large area, especially flake-like, very small particles are captured in the secondary circuit from the particle flow in the primary circuit and separated out separately. The process involves classifying the material processed by a reduction device (10) into coarser and finer fractions of a particle-laden carrier gas flow in a primary sifting circuit (P) according to specific weight and/or form and recirculating the coarser fraction for re-processing in the reduction device. A secondary sifting circuit (S) branches off the primary sifting circuit. By setting a flow speed difference at a pressure stage (5-7) between the primary and secondary circuits, large area, especially flake-like, very small particles are captured in the secondary circuit from the particle flow in the primary circuit and separated out separately. Independent claims are also included for the following: a system for carrying out the process.
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