发明名称 Apparatus and method for controlling the depth of immersion of a semiconductor element in an exposed surface of a viscous fluid
摘要 A method and apparatus for achieving a consistent depth of immersion of a semiconductor element into an exposed surface of an adhesive material pool when applying the adhesive material, conductive or non-conductive, to the semiconductor element or portion thereof. The consistent depth of immersion is defined by a stop which is attached to a reservoir used to form the adhesive material pool, attached to a stencil which is used in conjunction with the reservoir to form a level upper surface on the adhesive material, or operates independently from the reservoir and/or stencil.
申请公布号 US6336974(B1) 申请公布日期 2002.01.08
申请号 US19980183233 申请日期 1998.10.29
申请人 MICRON TECHNOLOGY, INC. 发明人 AHMAD SYED SAJID
分类号 H01L21/00;H01L21/58;H01L23/495;(IPC1-7):B05C3/00 主分类号 H01L21/00
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