发明名称 Semiconductor device having multilayer wiring structure and method for manufacturing the same
摘要 A method for manufacturing a semiconductor device includes a step of forming a first groove in a first insulating film, forming a conductive film in the first groove, a step of selectively forming a second insulating film on the conductive film and the first insulating film, a step of forming a second groove by removing part of the conductive film using the second insulating film as a mask, the second groove being formed so as to form a connecting portion of the conductive film under the second insulating film and form a first wiring layer by forming the connecting portion with a bottom of the first groove integrally with each other as one unit.
申请公布号 US2001055872(A1) 申请公布日期 2001.12.27
申请号 US20010882435 申请日期 2001.06.15
申请人 FUKAZAWA YUJI 发明人 FUKAZAWA YUJI
分类号 H01L23/522;H01L21/4763;H01L21/768;H01L23/48;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L23/522
代理机构 代理人
主权项
地址