发明名称 Semiconductor device and method and apparatus for manufacturing the same
摘要 In a semiconductor device, an interlevel insulating film formed between a Cu interconnection, formed by damascene, and an upper metal interconnection layer on it has a multilayered structure made up of a Cu diffusion preventive insulating layer and another insulating film. The Cu diffusion preventive insulating layer has a multilayered structure made up of not less than two layers. A method for manufacturing the semiconductor device is also disclosed.
申请公布号 US2001054765(A1) 申请公布日期 2001.12.27
申请号 US20010883370 申请日期 2001.06.19
申请人 NEC CORPORATION 发明人 OHTO KOICHI;MATSUI TAKAYUKI
分类号 C23C16/30;C23C16/32;C23C16/34;C23C16/36;H01L21/318;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L23/053;H01L23/12;H01L23/48 主分类号 C23C16/30
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