发明名称 CURVATURE MEASURING METHOD AND APPARATUS
摘要 PROBLEM TO BE SOLVED: To keep the measuring accuracy higher while simplifying the measurement of the radius of curvature. SOLUTION: The condensing point of light focused on a reference spherical surface is positioned at a point separated by a specified distance R0 along the optical axis of the reference spherical surface to the side of the center of curvature from the top of a measuring surface Aa of an spherical object A to be examined and under such a condition, with the interference between the light reflected on the reference spherical surface and the light reflected on the measuring surface Aa, an interference fringe generated is analyzed to obtain a correction-based shape data f (ΔR) and a virtual shape data f (R0) obtained by the conversion of the specified distance R0 as the radius of curvature is added to the correction-based shape data f(ΔR) to obtain an actual shape data f(R) of the measuring surface Aa. The radius of curvature R of the measuring surface Aa is obtained from the actual shape data f (R). This eliminates time and labor required for the alignment between the center of curvature of the reference spherical surface and the center O of curvature of the measuring surface Aa thereby maintaining the accuracy of measuring the curvature while simplifying the measurement.
申请公布号 JP2001356069(A) 申请公布日期 2001.12.26
申请号 JP20000178764 申请日期 2000.06.14
申请人 RICOH CO LTD 发明人 TAKAI MASAAKI
分类号 G01B11/24;G01B11/255;G01M11/00;(IPC1-7):G01M11/00 主分类号 G01B11/24
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