SEMICONDUCTOR DEVICE AND ITS INSPECTING METHOD

摘要

PROBLEM TO BE SOLVED: To directly confirm whether a power supply and a burn-in mode set signal for a burn-in test are fed to a semiconductor device at the burn-in test. SOLUTION: This semiconductor device is provided with a detecting means 10 detecting the presence or absence of the power supply for the burn-in test and the input of the burn-in mode set signal and a detection result storage region 11 storing the detection result by the detecting means 10, thereby whether a load is applied or not to the semiconductor device at the burn-in test can be judged.