Probe card for testing an integrated circuit chip

摘要

A probe card for use in testing at least two Quad Pad IC chips at the same time, includes a printed circuit board having an aperture extending therethrough, a plurality of pins for probing contact pads formed on the chips and electrically connected to the circuitry of the printed circuit board, a fixing ring extending around the aperture and positioning the pins relative to the test chips, and a fixing bridge traversing the fixing ring and disposed over a region between two of the test chip locations. Those pins which are for contacting the contact pads closest to the fixing ring protrude from and are supported by the sides of the fixing ring. On the other hand, the contact pads which will lie rather far from the sides of the fixing ring are probed by pins protruding from and supported by the fixing bridge.