发明名称 |
STATIC RANDOM ACCESS MEMORY OF CMOS, MEMORY CIRCUIT, AND METHOD FOR GENERATING SENSE-ENABLE SIGNAL |
摘要 |
PROBLEM TO BE SOLVED: To provide a technology by which a signal is supplied by using a self-measuring method and a sense amplifier is turned on, and multi-memory cells in a duplication column are made approximately the same capacitance as a reference bit line. SOLUTION: A CMOS memory array includes many bit cells 12 arranged in a SRAM array 11 of N rows×M columns, and has a duplication columns 60 of the bit cell 12 utilized for self-measuring. The bit cells 12 of the prescribed numbers are accessed by receiving addresses, and a reset signal utilized for enabling a sense amplifier 34 sampling bit lines of the SRAM array 11 is generated.
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申请公布号 |
JP2001351385(A) |
申请公布日期 |
2001.12.21 |
申请号 |
JP20000355706 |
申请日期 |
2000.11.22 |
申请人 |
HITACHI LTD |
发明人 |
SHIN JIN-UK LUKE;OSADA KENICHI;KHAN MASOOD |
分类号 |
G11C11/417;G11C7/06;G11C7/10;G11C7/22;G11C11/413;(IPC1-7):G11C11/417 |
主分类号 |
G11C11/417 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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