发明名称 SERIAL INTERFACE CIRCUIT AND ITS TESTING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a serial/parallel interface capable of determining at what point of time an error occurred on output data. SOLUTION: The data set on an internal register are temporarily retained on a latch circuit after being read out, and the data retained on the latch circuit are read out. Serial data are read out interlockingly with the lack or excess readout clocks, readout is repeated according to the number of the data on the internal register, and the first readout data are compared with the second and subsequent readout data. If a difference is detected, it is judged that a noise is mixed in readout clocks.
申请公布号 JP2001350675(A) 申请公布日期 2001.12.21
申请号 JP20000171497 申请日期 2000.06.08
申请人 TOSHIBA CORP;TOSHIBA DIGITAL MEDIA ENGINEERING CORP 发明人 MIYAZAKI ISAO
分类号 G06F13/12;G06F11/00;G06F11/22;G06F13/00;G06F13/38;H03M9/00 主分类号 G06F13/12
代理机构 代理人
主权项
地址