发明名称 AUTOMATIC FORMING METHOD FOR TEST DATA
摘要 PROBLEM TO BE SOLVED: To provide an automatic forming method for test data capable of automatically forming test data. SOLUTION: In this method for automatically forming test data, a key code initial value is made to increase and decrease corresponding to an item name constituting the test data by a key code increase and decrease value, the data are made to increase and decrease from an initial value by the increase and decrease value, the data are registered, and the data registration is performed until the registered data number reaches the number of test data.
申请公布号 JP2001350649(A) 申请公布日期 2001.12.21
申请号 JP20000167781 申请日期 2000.06.05
申请人 TOSHIBA TEC CORP 发明人 MATSUMOTO YOSHITO
分类号 G06F11/28;(IPC1-7):G06F11/28 主分类号 G06F11/28
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