发明名称 X-ray examination apparatus
摘要 An X-ray examination apparatus has a base and a support connected by an arm arrangement. The support is connected to a holding device in which a curved carrier is displaceably mounted, the curved carrier having an X-ray emitter at one end and a radiation detector at an opposite end. An examination table is movable between the X-ray emitter and the radiation detector. The arm arrangement is composed of at least first and second arms. The first arm is rotatably mounted at a shaft at the base, and the second arm is rotatably mounted at a shaft at the carrier. The respective free ends of the first and second arms are rotatably connected to each other by another shaft. The carrier, without bothersome components of the stand beneath the examination table, can be rotated 90° from a head-adjusted position in both directions to lateral positions, while maintaining the isocenter at a fixed position, and the carrier also can be lowered to the floor on which the base is disposed. For this purpose, the first and second arms are disposed in different planes and have respective lengths, dependent on the position of the shaft at the base and the distance between the shaft of the support and the central beam of the X-ray emitter, so that the curved carrier, by means of the arms, can be rotated around an intersecting point formed by the central beam of the X-ray emitter cutting the center line of the examination table, with a centrally head-adjusted stand.
申请公布号 US2001053201(A1) 申请公布日期 2001.12.20
申请号 US20000736311 申请日期 2000.12.15
申请人 LEANDERSSON ENAR;BORGGREN ARNE;NARFSTROM JAN 发明人 LEANDERSSON ENAR;BORGGREN ARNE;NARFSTROM JAN
分类号 A61B6/00;(IPC1-7):H05G1/02 主分类号 A61B6/00
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