发明名称 |
Voltage detecting circuit for semiconductor memory device |
摘要 |
A voltage detecting circuit includes a first voltage generator that provides a reference voltage, a second voltage generator that provides a comparison voltage in response to a boosted voltage, and a differential amplifier that provides an amplified difference signal to generate a voltage level detection signal in response to a voltage difference between the reference voltage and the comparison voltage. A bypass circuit is coupled to the amplified signal to detect a target VPP level suitable for a test mode by providing a current path in response to the comparison voltage when the comparison voltage reaches a predetermined level. The voltage detecting circuit thereby allows a precise and stable detecting operation to be performed regardless of the operation mode or process or temperature variations.
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申请公布号 |
US2001053097(A1) |
申请公布日期 |
2001.12.20 |
申请号 |
US20000748350 |
申请日期 |
2000.12.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
SIM JAE-YOON;YOO JEI-HWAN |
分类号 |
G11C5/14;(IPC1-7):G11C5/00 |
主分类号 |
G11C5/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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