发明名称 |
LASER ANNEALING APPARATUS AND METHOD FOR MANUFACTURING THIN FILM TRANSISTOR |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method and an apparatus for manufacturing a polycrystal silicon thin film transistor used for a pixel switch or a drive circuit of a liquid crystal display in a mass production at a good yield. SOLUTION: In a laser annealing apparatus 1 for generating a polycrystal silicon by radiating a pulse laser beam to a amorphous silicon, a plurality of peak groups included in the beam radiated to a glass board O are detected by a biplanar phototube 18, an angle of a resonance mirror 11a of a laser unit 11 is changed to an optimum so that (second peak group)/(first peak group) of the beam becomes a range of 0.37 to 0.47 or (area of second peak group)/(area of first peak group) becomes a range of 0.65 to 0.85 under the condition that a fluence dependence becomes gentle based on a result analyzed by an analyzer 20 and thereby a polycrystal silicon of a uniform grain size can be obtained.</p> |
申请公布号 |
JP2001338892(A) |
申请公布日期 |
2001.12.07 |
申请号 |
JP20000156529 |
申请日期 |
2000.05.26 |
申请人 |
TOSHIBA CORP |
发明人 |
MIHASHI HIROSHI;NAKAMURA ATSUSHI;MATSUNAKA SHIGEKI;SUMINO TSUTOMU |
分类号 |
G02F1/136;G02F1/1368;H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/268 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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