发明名称 LASER ANNEALING APPARATUS AND METHOD FOR MANUFACTURING THIN FILM TRANSISTOR
摘要 <p>PROBLEM TO BE SOLVED: To provide a method and an apparatus for manufacturing a polycrystal silicon thin film transistor used for a pixel switch or a drive circuit of a liquid crystal display in a mass production at a good yield. SOLUTION: In a laser annealing apparatus 1 for generating a polycrystal silicon by radiating a pulse laser beam to a amorphous silicon, a plurality of peak groups included in the beam radiated to a glass board O are detected by a biplanar phototube 18, an angle of a resonance mirror 11a of a laser unit 11 is changed to an optimum so that (second peak group)/(first peak group) of the beam becomes a range of 0.37 to 0.47 or (area of second peak group)/(area of first peak group) becomes a range of 0.65 to 0.85 under the condition that a fluence dependence becomes gentle based on a result analyzed by an analyzer 20 and thereby a polycrystal silicon of a uniform grain size can be obtained.</p>
申请公布号 JP2001338892(A) 申请公布日期 2001.12.07
申请号 JP20000156529 申请日期 2000.05.26
申请人 TOSHIBA CORP 发明人 MIHASHI HIROSHI;NAKAMURA ATSUSHI;MATSUNAKA SHIGEKI;SUMINO TSUTOMU
分类号 G02F1/136;G02F1/1368;H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/268 主分类号 G02F1/136
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