| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor magnetoresistance element in which the position of a semiconductor substrate can be identified in a wafer and productivity of a detection element comprising a semiconductor reluctance element can be enhanced. SOLUTION: In a semiconductor magnetoresistance element 1 where a semiconductor magnetoresistance film 3 is formed on a semiconductor substrate 2, an identification number (identification symbol) 6 indicative of the position of the semiconductor substrate 2 in a wafer 7 is provided on the rear surface 2b of the semiconductor substrate 2.
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