Event-based semiconductor test system for testing semiconductor components, has controller that regulates overall system activity and supplies test programs with event time control data to event memory

摘要

A controller regulates overall system activity by establishing communication with the event control unit in every pin unit, and supplying test programs with event time control data to the event memory in every pin unit. The test end signal for every pin unit is selected based on conditions established by system control. The chosen test end signal is supplied to other pin units and the system control. The pin units have allocated pins for a tested semiconductor component, in which each pin unit works independently. The event memory of each pin unit stores the event time control data for generating test signals provided to the corresponding pin of the tested semiconductor component. An event control unit regulates the overall activity of the pin unit by generating test signals based on the event time control data from the event memory, and determines a response output signal from the tested semiconductor component. The test end signal indicates the completion of a run test procedure executed by a pertinent pin unit.