Method and apparatus for edge-endpoint-based VLSI design rule checking

摘要

The method and apparatus for performing design rule checking on Manhattan structures in VLSI circuit layouts. The method and apparatus provides an edge-endpoint-based technique for checking the geometry and spacing of the VLSI circuit layout. The edge-endpoint-based technique uses a scanline algorithm that detects errors between adjacent structures that do not simultaneously intersect the scanline. The method also provides efficient error compilation. The apparatus allows for the design rules to be changed as the VLSI circuit layout evolves. The apparatus can process the VLSI circuit layout with a single processor, and the apparatus provides for multiple processors to process slices of the VLSI circuit layout, thereby enhancing the speed of the design rule checking over traditional software-only techniques.