发明名称 Self-testable spacecraft for self-testing analog functions
摘要 A circuit for testing the functionality of an analog circuit of a satellite includes a multiplexer that is coupled to a circuit element to be tested. An analog-to-digital converter is coupled to the multiplexer. A test signal generator is coupled to a controller. The controller is also coupled to the analog-to-digital converter. The controller generates test signals that are coupled to the circuit element. Response signals are generated from the circuit elements and are received by the controller through the multiplexer and analog-to-digital converter. The controller compares the response signals to a predetermined signal indicative of a proper response. An indicator is coupled to the controller to provide an indication of whether or not the circuit elements are functioning properly.
申请公布号 US6324484(B1) 申请公布日期 2001.11.27
申请号 US19990235708 申请日期 1999.01.22
申请人 HUGHES ELECTRONICS CORPORATION 发明人 GUNDERSEN JAMES L.
分类号 G01R31/00;G01R31/28;(IPC1-7):G01M19/00 主分类号 G01R31/00
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