发明名称 PROBE FOR SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To reduce a Q value of resonance of a probe by taking Q/ωas a parameter into a design item in a scanning-type scanning probe microscope. SOLUTION: A means for minimizing the Q value of the resonance of the probe is used as a means for reducing an inherent mechanical relaxation time of the probe required for changing kinetic energy of vibration of the probe following scanning on the sample surface, by increasing a force for damping vibration of a lever 1 by enlarging the surface area of a face 1c on the side having the probe 2 of the lever 1.
申请公布号 JP2001318043(A) 申请公布日期 2001.11.16
申请号 JP20000137192 申请日期 2000.05.10
申请人 NEC CORP 发明人 NAITO YUICHI;OKUBO NORIO
分类号 G01B21/00;G01B21/30;G01Q10/00;G01Q30/08;G01Q30/20;G01Q60/32;G01Q60/38;G01Q70/10;(IPC1-7):G01N13/16;G01N13/10;G12B21/22 主分类号 G01B21/00
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