发明名称 |
Wiring-capacitance improvement aid device aiding in improvement of points having wiring-capacitance attributable error only with layout modification, method thereof, and medium having a program therefor recorded therein |
摘要 |
A wiring-capacitance improvement aid device aiding in eliminating a capacitance-attributable error of layout data generated by an automatic arrangement and routing tool includes a subject-net extraction portion extracting a subject net with a capacitance-attributable error, a network rip-up portion ripping up a cell netted within a predetermined range with respect to a subject net extracted by the subject-net extraction portion, and a constraint imposition portion imposing a wiring-capacitance constraint on a net connected to a cell ripped up by the network rip-up portion.
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申请公布号 |
US6317865(B1) |
申请公布日期 |
2001.11.13 |
申请号 |
US19990275083 |
申请日期 |
1999.03.24 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
ITOH NIICHI |
分类号 |
H01L21/82;G06F17/50;(IPC1-7):G06F15/60 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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