发明名称 |
Method for fabricating a memory cell having a MOS transistor |
摘要 |
A memory cell has a vertical MOS transistor which contains a first electrically insulated gate electrode and a second gate electrode. The second gate electrode is partially disposed in a trench whose sidewall is adjoined by the MOS transistor. The first gate electrode is disposed outside the trench and has a tip at an edge of the trench. The tip enables programming with a reduced current flow. The memory cell can be fabricated by self-aligning fabrication with an area requirement of six F2.
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申请公布号 |
US6316315(B1) |
申请公布日期 |
2001.11.13 |
申请号 |
US20000642328 |
申请日期 |
2000.08.21 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
HOFMANN FRANZ;WILLER JOSEF |
分类号 |
H01L29/43;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/49;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 |
主分类号 |
H01L29/43 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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