发明名称 Method for fabricating a memory cell having a MOS transistor
摘要 A memory cell has a vertical MOS transistor which contains a first electrically insulated gate electrode and a second gate electrode. The second gate electrode is partially disposed in a trench whose sidewall is adjoined by the MOS transistor. The first gate electrode is disposed outside the trench and has a tip at an edge of the trench. The tip enables programming with a reduced current flow. The memory cell can be fabricated by self-aligning fabrication with an area requirement of six F2.
申请公布号 US6316315(B1) 申请公布日期 2001.11.13
申请号 US20000642328 申请日期 2000.08.21
申请人 INFINEON TECHNOLOGIES AG 发明人 HOFMANN FRANZ;WILLER JOSEF
分类号 H01L29/43;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/49;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 H01L29/43
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