发明名称 Process for harmonic measurement accuracy enhancement
摘要 A method for determining the harmonic response of a device under test (DUT) to the input fundamental frequency component of an input signal is performed on a vector network analyzer. A first response of the DUT at the harmonic frequency is obtained by measuring the linear response of the device at the harmonic frequency of interest after appropriate normalization. A second response of the DUT is obtained by measuring the response of the DUT at the harmonic frequency to an input which comprises a source input fundamental with its harmonic components after appropriate normalization. The harmonic response of the DUT to the source input fundamental alone is computed from the first and second responses. Such computations allow the harmonic response of the DUT to be measured free of stimulus source harmonics, so that overall harmonic measurement accuracy and dynamic range is enhanced.
申请公布号 US6316945(B1) 申请公布日期 2001.11.13
申请号 US19990388014 申请日期 1999.09.01
申请人 ANRITSU COMPANY 发明人 KAPETANIC PETER;MARTENS JON;RANGEL DAVID
分类号 G01R23/20;G01R27/28;G01R27/32;(IPC1-7):G01R27/28 主分类号 G01R23/20
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