发明名称 Method of fabricating a node contact
摘要 A method of fabricating a node contact opening is described. A dielectric layer is formed on a substrate. A first conductive layer is formed on the dielectric layer. The first conductive layer is etched to form a trapezoidally cross-sectioned opening exposing a portion of the dielectric layer. The dielectric layer exposed by the trapezoidally cross-sectioned opening is etched to form a node contact opening in the dielectric layer exposing a part the substrate. A second conductive layer is formed to fill the node contact opening and in contact with the conductive layer.
申请公布号 US6316368(B1) 申请公布日期 2001.11.13
申请号 US19990286080 申请日期 1999.04.05
申请人 UNITED MICROELECTRONICS CORP. 发明人 LIN KWANG-MING;PENG TZU-MIN;CHEN CHIEH-TE;LIU PANG-MIAO
分类号 H01L21/033;H01L21/311;H01L21/768;(IPC1-7):H01L21/302 主分类号 H01L21/033
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