发明名称 PHOTOMASK AND LEVELING MANAGEMENT METHOD USING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a photomask which can manage the presence or absence of a level difference at an exposure surface and a leveling management method using the same. SOLUTION: This photomask has a pattern for leveling management formed in a region consisting of a mask material for halftones. The pattern for leveling management has the first hole pattern for level difference inspection consisting of an approximate circle in the diameter (a) of a plane shape and the second hole pattern for level difference inspection consisting of an approximate circle in the diameter (a) of a plane shape. The spacing between the center of the first hole pattern for level difference inspection and the center of the second hole pattern for level difference inspection is confined to <=5a.</p>
申请公布号 JP2001305712(A) 申请公布日期 2001.11.02
申请号 JP20000119723 申请日期 2000.04.20
申请人 SEIKO EPSON CORP 发明人 KANETANI NOBUHIRO
分类号 G03F1/38;G03F1/68;G03F1/70;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/38
代理机构 代理人
主权项
地址