发明名称 EQUIPMENT AND METHOD FOR SIMULATING SEMICONDUCTOR DEVICE AND RECORDING MEDIUM WITH SIMULATION PROGRAM RECORDED THEREIN
摘要 <p>PROBLEM TO BE SOLVED: To shorten calculation time by setting better initial values in the case of the analysis with external circuits in the numerical analysis of the device by computer. SOLUTION: The device simulation equipment 10 is equipped with an estimated potential designating means 12 by which users specify the estimated potential of the device electrode joint, a physical quantity initial value setting means 14 for obtaining the physical quantity by using the estimated potential and for setting the physical quantity as a physical quantity initial value in the internal joint of the device, a potential initial value setting means 16 for setting the potential initial value in the external circuit joint, based on the estimated potential, and a device analysis means 18 for analyzing the devices with the external circuits by using each of the setting initial values. The better initial values can be obtained by using the electrode joint potential of the device which users estimate.</p>
申请公布号 JP2001308201(A) 申请公布日期 2001.11.02
申请号 JP20000122013 申请日期 2000.04.24
申请人 NEC CORP 发明人 YOKOTA IKUHIRO
分类号 G06F17/50;G06F19/00;H01L21/336;H01L21/8238;H01L27/092;H01L29/00;H01L29/78;(IPC1-7):H01L21/823 主分类号 G06F17/50
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