发明名称 |
SIMPLE INSPECTION KIT FOR MITE ALLERGEN AND METHOD FOR DETECTING MITE ALLERGEN USING IT |
摘要 |
PROBLEM TO BE SOLVED: To provide a mite allergen inspection kit with which the mite allergen level in an environment can be sensed easily in a short time and a method for detecting mite allergen. SOLUTION: The mite allergen inspection kit utilizes an antigen-antibody reaction using both or either one of Derf2 which is one of the principal allergens of a mite allergy and Derp2 as antigens. This kit can detect the mite allergen level from a developed color. The kit uses gold colloid or fine plastic particles as an antibody protein carrier in the antigen-antibody reaction and the mite allergen level can be determined by sensing from the density and number of colored lines developed by the coagulation of the colloid plastic particles.
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申请公布号 |
JP2001305134(A) |
申请公布日期 |
2001.10.31 |
申请号 |
JP20000121503 |
申请日期 |
2000.04.21 |
申请人 |
SHINTO FINE CO LTD |
发明人 |
UEHARA KOZO;TERASAKI MARIKO |
分类号 |
G01N33/53;G01N33/543;G01N33/545;G01N33/553;(IPC1-7):G01N33/53 |
主分类号 |
G01N33/53 |
代理机构 |
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主权项 |
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地址 |
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