发明名称 SIMPLE INSPECTION KIT FOR MITE ALLERGEN AND METHOD FOR DETECTING MITE ALLERGEN USING IT
摘要 PROBLEM TO BE SOLVED: To provide a mite allergen inspection kit with which the mite allergen level in an environment can be sensed easily in a short time and a method for detecting mite allergen. SOLUTION: The mite allergen inspection kit utilizes an antigen-antibody reaction using both or either one of Derf2 which is one of the principal allergens of a mite allergy and Derp2 as antigens. This kit can detect the mite allergen level from a developed color. The kit uses gold colloid or fine plastic particles as an antibody protein carrier in the antigen-antibody reaction and the mite allergen level can be determined by sensing from the density and number of colored lines developed by the coagulation of the colloid plastic particles.
申请公布号 JP2001305134(A) 申请公布日期 2001.10.31
申请号 JP20000121503 申请日期 2000.04.21
申请人 SHINTO FINE CO LTD 发明人 UEHARA KOZO;TERASAKI MARIKO
分类号 G01N33/53;G01N33/543;G01N33/545;G01N33/553;(IPC1-7):G01N33/53 主分类号 G01N33/53
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