发明名称 SPUTTERING APPARATUS AND SPUTTERING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a sputtering apparatus and a sputtering method having high degree of freedom of a target material without impairing the discharge stability or the mass productivity, and to provide a manufacturing method of an optical disk with reduced defects and excellent mass productivity. SOLUTION: In a target and a backing plate charged in each film deposition chamber of the sputtering apparatus having a plurality of film deposition chambers, the contours of the targets in a placed condition are common to each other, and the joining position with the backing plate is arbitrarily changed according to the thickness of the target.
申请公布号 JP2001303244(A) 申请公布日期 2001.10.31
申请号 JP20000122059 申请日期 2000.04.24
申请人 TDK CORP 发明人 TAMAGAWA YOSHIHISA;ISHIZAKI HIDEKI;KOSUDA MASANORI
分类号 B01J19/08;C23C14/34;G11B7/26;(IPC1-7):C23C14/34 主分类号 B01J19/08
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