发明名称 |
PROCEDE DE TRAITEMENT DE SUBSTRATS POUR LA MICROELECTRONIQUE ET SUBSTRATS OBTENUS PAR CE PROCEDE |
摘要 |
<p>The invention relates to a process for the treatment of substrates ( 1 ) for microelectronics or optoelectronics comprising a working layer ( 6 ) at least partially composed of an oxidizable material on at least one of their faces, this process comprising: a first sacrificial oxidation stage for removing material constituting the working layer ( 6 ) over a certain surface thickness of each substrate ( 1 ), a stage of polishing ( 200 ) the face which has been subjected to the first sacrificial oxidation stage ( 100 ), and a second sacrificial oxidation stage for again removing material constituting the working layer ( 6 ) on the polished face ( 17 ).</p> |
申请公布号 |
FR2797714(B1) |
申请公布日期 |
2001.10.26 |
申请号 |
FR19990010668 |
申请日期 |
1999.08.20 |
申请人 |
S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES |
发明人 |
BARGE THIERRY;GHYSELEN BRUNO;IWAMATSU TOSHIAKI;NARUOKA HIDEKI;FURIHATA JUNICHIRO;MITANI KIYOSHI |
分类号 |
H01L21/306;H01L21/762;(IPC1-7):H01L21/306;G02B6/43 |
主分类号 |
H01L21/306 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|