发明名称 PROCEDE DE TRAITEMENT DE SUBSTRATS POUR LA MICROELECTRONIQUE ET SUBSTRATS OBTENUS PAR CE PROCEDE
摘要 <p>The invention relates to a process for the treatment of substrates ( 1 ) for microelectronics or optoelectronics comprising a working layer ( 6 ) at least partially composed of an oxidizable material on at least one of their faces, this process comprising: a first sacrificial oxidation stage for removing material constituting the working layer ( 6 ) over a certain surface thickness of each substrate ( 1 ), a stage of polishing ( 200 ) the face which has been subjected to the first sacrificial oxidation stage ( 100 ), and a second sacrificial oxidation stage for again removing material constituting the working layer ( 6 ) on the polished face ( 17 ).</p>
申请公布号 FR2797714(B1) 申请公布日期 2001.10.26
申请号 FR19990010668 申请日期 1999.08.20
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES 发明人 BARGE THIERRY;GHYSELEN BRUNO;IWAMATSU TOSHIAKI;NARUOKA HIDEKI;FURIHATA JUNICHIRO;MITANI KIYOSHI
分类号 H01L21/306;H01L21/762;(IPC1-7):H01L21/306;G02B6/43 主分类号 H01L21/306
代理机构 代理人
主权项
地址