发明名称 Memory configuration including a plurality of resistive ferroelectric memory cells
摘要 A memory configuration includes a plurality of resistive ferroelectric memory cells. Each of the memory cells includes a selection transistor and a storage capacitor. The selection transistor has a given zone of a first conductivity type. The storage capacitor has a first and a second electrode. The first electrode is supplied with a fixed cell plate voltage, the second electrode is connected to the given zone of the first conductivity type. A source and a drain of a MOS transistor are supplied with the fixed cell plate voltage. The channel of the MOS transistor has a channel length extending over at least two of the memory cells. The given zone of the first conductivity type is connected, via a resistor, to the channel of the MOS transistor such that the given zone is electrically connected to the first electrode of the storage capacitor via the resistor and the MOS transistor.
申请公布号 US2001033516(A1) 申请公布日期 2001.10.25
申请号 US20010767805 申请日期 2001.01.22
申请人 KOWARIK OSKAR;HOFFMANN KURT 发明人 KOWARIK OSKAR;HOFFMANN KURT
分类号 G11C11/22;H01L21/8246;H01L27/105;(IPC1-7):G11C7/00 主分类号 G11C11/22
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