发明名称 |
Memory configuration including a plurality of resistive ferroelectric memory cells |
摘要 |
A memory configuration includes a plurality of resistive ferroelectric memory cells. Each of the memory cells includes a selection transistor and a storage capacitor. The selection transistor has a given zone of a first conductivity type. The storage capacitor has a first and a second electrode. The first electrode is supplied with a fixed cell plate voltage, the second electrode is connected to the given zone of the first conductivity type. A source and a drain of a MOS transistor are supplied with the fixed cell plate voltage. The channel of the MOS transistor has a channel length extending over at least two of the memory cells. The given zone of the first conductivity type is connected, via a resistor, to the channel of the MOS transistor such that the given zone is electrically connected to the first electrode of the storage capacitor via the resistor and the MOS transistor.
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申请公布号 |
US2001033516(A1) |
申请公布日期 |
2001.10.25 |
申请号 |
US20010767805 |
申请日期 |
2001.01.22 |
申请人 |
KOWARIK OSKAR;HOFFMANN KURT |
发明人 |
KOWARIK OSKAR;HOFFMANN KURT |
分类号 |
G11C11/22;H01L21/8246;H01L27/105;(IPC1-7):G11C7/00 |
主分类号 |
G11C11/22 |
代理机构 |
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地址 |
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