发明名称 |
Look ahead scan chain diagnostic method |
摘要 |
Look ahead testing process diagnoses broken or stuck-at scan chains to a failing shift register latch for improving the final manufacturing process and suggesting potentials for design change prior to manufacturing in order to improve yield levels. Post test data collection, analysis, and diagnosis can be eliminated.
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申请公布号 |
US6308290(B1) |
申请公布日期 |
2001.10.23 |
申请号 |
US19990315461 |
申请日期 |
1999.05.20 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
FORLENZA ORAZIO P.;KUSKO MARY P.;MOTIKA FRANCO |
分类号 |
G01R31/3185;G11C19/00;G11C29/32;(IPC1-7):G06F11/00 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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