发明名称 IMAGE PHOTOGRAPHING METHOD FOR FLAW-DETECTION AND FLAW INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a image photographing method of flaw detection and a flaw inspection device for producing effects of improved resolution in flaw detection, without having to use high-resolution camera in photographing an image for detecting streak flaws on the surface of a metal plate by means of an area camera. SOLUTION: A plurality of images for flaw detection are obtained when an object to be inspes 50 is photographed by means of a photographing device 11 serving as a reference and one or more photographing devices 12, 13 and 14, in which a plane normal to the optical axial is turned at an optional angle ranging from 0 degrees to 90 degrees, simultaneously. The flaw inspection device is provided with a photographing device unit 10, which is constituted of a distribution optical system 15, the photographing device 11 serving as a reference, and one or more photographing devices 12, 13 and 14 turned at an arbitrary angle, an image layout device 20, a flaw detector 21, and a flaw position output device 22.
申请公布号 JP2001289789(A) 申请公布日期 2001.10.19
申请号 JP20000100719 申请日期 2000.04.03
申请人 TOPPAN PRINTING CO LTD 发明人 AKIYAMA NAOYUKI
分类号 G01B11/30;G01N21/892;G06T1/00 主分类号 G01B11/30
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