发明名称 Wiring for semiconductor device and method for forming the same
摘要 Wiring for a semiconductor device which is suitable for high density device packing, and a method for forming the same, are disclosed. The wiring includes: impurity regions formed in a substrate on both sides of an insulated gate electrode; a first conduction layer formed on the impurity regions; and a second conduction layer formed in contact with the first conduction layer on one side of the gate electrode. The method includes the steps of: forming impurity regions in a substrate on both sides of an insulated gate electrode; forming a first conduction layer on the impurity regions; and forming a second conduction layer in contact on one side of the gate electrode with the first conduction layer.
申请公布号 US2001030334(A1) 申请公布日期 2001.10.18
申请号 US20010883988 申请日期 2001.06.20
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 LEE CHANG JAE
分类号 H01L21/28;H01L21/768;H01L21/8242;H01L23/485;H01L27/108;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/28
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