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发明名称
METHOD OF DETERMINING THE THICKNESS OF MONOCRYSTALLINE LAYER OF SILICON OR GERMANIUM
摘要
申请公布号
CA700060(A)
申请公布日期
1964.12.15
申请号
CAD700060
申请日期
申请人
SIEMENS AND HALSKE AKTIENGESELLSCHAFT
发明人
HEINZ DORENDORF;ALBERT WALTHER
分类号
主分类号
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代理人
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