| 摘要 |
<p>This invention relates to a measurement system for use in computer aided manufacture or computer aided inspection comprising a base measurement system (4, 5a, 5b, 7a, 7b) and a sensor means (2), the sensor means being movable independently of the base measurement system and being arranged to determine the distance between the sensor means and a selected point, the base measurement system being arranged to determine the position of the sensor means relative to the base measurement system, the system comprising processor means (4) being arranged to receive information generated by the base measurement system and the sensor means and the processor means being further arranged to derive position information relating to the selected point relative to the base measurement system.</p> |
