发明名称 |
A METHOD AND APPARATUS FOR TESTING DIGITAL CIRCUITRY |
摘要 |
Digital circuitry is tested through effecting a paired data loop-back from a first buffered output to a first buffered input whilst within the circuitry executing at least part of the test through using a Built-In-Self-Test methodology. In particular, the loop-back is effected from the first buffered data output to a buffered control input, from a buffered control output to the first buffered data input, or both. Advantageously, the buffering is associated to executing a conversion between a digital full swing internal signal and an analog low swing external signal with respect to core circuitry of the digital circuitry.
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申请公布号 |
WO0177700(A1) |
申请公布日期 |
2001.10.18 |
申请号 |
WO2001EP03566 |
申请日期 |
2001.03.29 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
KUEGLER, MARCUS;BADIEI, ALI |
分类号 |
G01R31/28;G01R31/317;G01R31/3185;H03K19/0175;H04L1/24;H04L29/14;(IPC1-7):G01R31/318;H03K19/017 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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