发明名称 Adapting Scan-BIST architectures for low power operation
摘要 A Scan-BIST architecture is adapted into a low power Scan-BIST architecture. A generator 102, compactor 106, and controller 110 remain the same as in the known art. The changes between the known art Scan-BIST architecture and the low power Scan-BIST architecture involve modification of the known Scan path into Scan path 502, to insert Scan paths A 506, B 508 and C 510, and the insertion of an adaptor circuit 504 in the control path 114 between controller 110 and Scan path 502. <IMAGE>
申请公布号 EP1146343(A1) 申请公布日期 2001.10.17
申请号 EP20010000044 申请日期 2001.03.07
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 WHETSEL, LEE D.
分类号 G01R31/28;G01R31/317;G01R31/3185 主分类号 G01R31/28
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